Digital Systems Testing (January 2025): Difference between revisions
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| style="width: 5%" |0|| style="width: 10%" |Jan 23|| style="width: 30%" |Introduction | | style="width: 5%" |0|| style="width: 10%" |Jan 23|| style="width: 30%" |Introduction | ||
| style="width: | | style="width: 30%" | [https://drive.google.com/file/d/1I7K7oJL34muwrcj1m3b4yMM0rPUcG8qq/view?usp=sharing Zoom Meeting Summary] | ||
[https://drive.google.com/file/d/1I5FxoIGbwe4GUrxoHIaopzTZYbfDco6M/view?usp=sharing Lec00 Slide deck] | [https://drive.google.com/file/d/1I5FxoIGbwe4GUrxoHIaopzTZYbfDco6M/view?usp=sharing Lec00 Slide deck] | ||
[https://drive.google.com/file/d/1Gpn3s9xoJXdw76-6BVaL4w_z9eT0r-N8/view?usp=sharing Meeting Recording] | [https://drive.google.com/file/d/1Gpn3s9xoJXdw76-6BVaL4w_z9eT0r-N8/view?usp=sharing Meeting Recording] | ||
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|| [https://drive.google.com/file/d/15JcG_S5gxT9l3SvFEVYPXmW_MNqejSq-/view?usp=sharing Lec01 Slide deck] | || [https://drive.google.com/file/d/15JcG_S5gxT9l3SvFEVYPXmW_MNqejSq-/view?usp=sharing Lec01 Slide deck] | ||
[https://drive.google.com/file/d/18s9LymSIjTMb9KfxBHBqPRrs32Uul-S_/view?usp=sharing Lec02 Slide deck] | [https://drive.google.com/file/d/18s9LymSIjTMb9KfxBHBqPRrs32Uul-S_/view?usp=sharing Lec02 Slide deck] | ||
[https://drive.google.com/file/d/1QPs4cNxJgvaHfM2eW2iOR6WZf9Up79oA/view?usp=sharing Meeting Recording] | [https://drive.google.com/file/d/1QPs4cNxJgvaHfM2eW2iOR6WZf9Up79oA/view?usp=sharing Meeting Recording] | ||
|| | || Journal and Quiz (in UVLe) | ||
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|2||Feb 6 ||Fault models | |2||Feb 6 ||Fault models | ||
|| [https://drive.google.com/file/d/1zcI2cZeu5UoxL3b6aeZuI8PraK3bW3ih/view?usp=sharing Lec03 Self Review] | || [https://drive.google.com/file/d/1zcI2cZeu5UoxL3b6aeZuI8PraK3bW3ih/view?usp=sharing Lec03 Self Review] | ||
[https://drive.google.com/file/d/1M6rK0t-tKQxU7Uor6LYPQ4jJOYCMWHhI/view?usp=sharing Lec04 Slide deck] | [https://drive.google.com/file/d/1M6rK0t-tKQxU7Uor6LYPQ4jJOYCMWHhI/view?usp=sharing Lec04 Slide deck] | ||
[https://drive.google.com/file/d/1n91sQf7mhfeYW7HRE6TN3XBcAvoviqKP/view?usp=sharing Lec05 Slide deck] | [https://drive.google.com/file/d/1n91sQf7mhfeYW7HRE6TN3XBcAvoviqKP/view?usp=sharing Lec05 Slide deck] | ||
[https://drive.google.com/file/d/1IFvAxbFUZVqmQNbtvh-y9C-n9YZzMTtA/view?usp=sharing Meeting Recording] | [https://drive.google.com/file/d/1IFvAxbFUZVqmQNbtvh-y9C-n9YZzMTtA/view?usp=sharing Meeting Recording] | ||
|| | || Homework (from Lec04) | ||
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|2||Feb 13 ||Algorithms for fault testing | |2||Feb 13 ||Algorithms for fault testing | ||
|| [ | || [https://drive.google.com/file/d/1RRDTvOvk4S8I9ylYb9TVEhhVJ9r-Ks_k/view?usp=sharingLec06 Exercises] | ||
[https://drive.google.com/file/d/1k5We-tzhZL1Udz1VWNu4Ec8bWwQNILGb/view?usp=sharing Lec07 Slide Deck] | [https://drive.google.com/file/d/1k5We-tzhZL1Udz1VWNu4Ec8bWwQNILGb/view?usp=sharing Lec07 Slide Deck] | ||
[https://drive.google.com/file/d/1Z9fKCIdmDTIUZgNmEa9xUj48elnLggcH/view?usp=sharing Meeting Recording] | |||
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|3||Feb 20 ||Sequential circuit testing | |3||Feb 20 ||Sequential circuit testing | ||
|| [Lec08 | || [https://drive.google.com/file/d/1L2sYJ5mutaRR6r8ufMQ63P7-LK0FiWT-/view?usp=sharing Lec08 Slide Deck] | ||
[Lec 09 | [https://drive.google.com/file/d/1fRHaI0oHr1VgQZYqDA0ssbZ52QqJxW6k/view?usp=sharing Lec 09 Slide Deck] | ||
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[Meeting Recording] | |||
|| Homework | |||
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|3||Feb 27 ||Fault Detection in Sequential Circuits | |3||Feb 27 ||Fault Detection in Sequential Circuits | ||
|| [Lec10 Time-Frame Expansion] | || [Lec10 Time-Frame Expansion] | ||
|| | || UVLe Quiz | ||
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| ||Mar 6 || | |4||Mar 6 ||Design for Test | ||
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| ||Mar 13 || | |4||Mar 13 ||Built-in Self-Test | ||
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| ||Mar 20 || | |5||Mar 20 ||Memory Testing | ||
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| ||Mar 27 || | |6||Mar 27 ||SCOAP Measurements | ||
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==Announcements== | ==Announcements== | ||
*'''Feb 6''': The meeting on '''Feb 13''' will be in hybrid mode. Those attending the face-to-face meeting can proceed to Rm 307 for our class. | |||
*'''Jan 23''': This will be our class home page. For those enrolled in EE 269, assessment submissions will be through UVLe | *'''Jan 23''': This will be our class home page. For those enrolled in EE 269, assessment submissions will be through UVLe | ||
==References== | ==References== | ||
*Book References | *Book References | ||
Latest revision as of 13:47, 20 February 2025
- Digital Systems Testing
- Second Semester AY 2024-2025
- Synchronous classes will be held Thursdays 6-9 PM
- Refer to the UP Diliman Academic Calendar for relevant dates and holidays.
- Course Credit: 3 units (3 hours lecture)
Catalog Description
Test economics and motivation. Fault models and simulation. Test pattern generation. Measures for testability. Design for testability. Memory testing.
Prerequisite: Digital Logic Design and Introduction to Semiconductor Devices
Course Outline
| Module | Date | Topic | Resources | Activity |
|---|---|---|---|---|
| 0 | Jan 23 | Introduction | Zoom Meeting Summary | |
| 1 | Jan 30 | Economics of Test | Lec01 Slide deck | Journal and Quiz (in UVLe) |
| 2 | Feb 6 | Fault models | Lec03 Self Review | Homework (from Lec04) |
| 2 | Feb 13 | Algorithms for fault testing | Exercises | |
| 3 | Feb 20 | Sequential circuit testing | Lec08 Slide Deck
[Meeting Recording] |
Homework |
| 3 | Feb 27 | Fault Detection in Sequential Circuits | [Lec10 Time-Frame Expansion] | UVLe Quiz |
| 4 | Mar 6 | Design for Test | ||
| 4 | Mar 13 | Built-in Self-Test | ||
| 5 | Mar 20 | Memory Testing | ||
| 6 | Mar 27 | SCOAP Measurements |
Announcements
- Feb 6: The meeting on Feb 13 will be in hybrid mode. Those attending the face-to-face meeting can proceed to Rm 307 for our class.
- Jan 23: This will be our class home page. For those enrolled in EE 269, assessment submissions will be through UVLe
References
- Book References
- M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing, Springer, 2005.
- Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman, “Digital Systems Testing & Testable Design”, IEEE Press, 1994
- Niraj Jha and Sandeep Gupta, “Testing of Digital Systems”, Cambridge University Press, 2003
- Z. Navabi, “Digital System Test and Testable Design”. Springer, 2011.
- Other References
- Lukac, M., Kameyama, M., Perkowski, M., & Kerntopf, P. (2019). USING HOMING, SYNCHRONIZING AND DISTINGUISHING INPUT SEQUENCES FOR THE ANALYSIS OF REVERSIBLE FINITE STATE MACHINES. Facta Universitatis, Series: Electronics and Energetics, 32(3), 417-438
- I. Pomeranz and S. Reddy, “Application of homing sequences to synchronous sequential circuit testing,” in Test Symposium, 1993., Proceedings of the Second Asian, pp. 324–329