Digital Systems Testing (January 2025)
Revision as of 11:36, 23 January 2025 by Anastacia Alvarez (talk | contribs) (Created page with "*'''Digital Systems Testing''' *Second Semester AY 2024-2025 **Synchronous classes will be held Thursdays 6-9 PM **Refer to the [https://our.upd.edu.ph/files/calendar/regular/ACAD%20CAL%202024-2025.pdf#page=3 UP Diliman Academic Calendar] for relevant dates and holidays. *Course Credit: 3 units (3 hours lecture) ==Catalog Description== Test economics and motivation. Fault models and simulation. Test pattern generation. Measures for testability. Design for testab...")
- Digital Systems Testing
- Second Semester AY 2024-2025
- Synchronous classes will be held Thursdays 6-9 PM
- Refer to the UP Diliman Academic Calendar for relevant dates and holidays.
- Course Credit: 3 units (3 hours lecture)
Catalog Description
Test economics and motivation. Fault models and simulation. Test pattern generation. Measures for testability. Design for testability. Memory testing.
Prerequisite: Digital Logic Design and Introduction to Semiconductor Devices
Course Outline
| Module | Date | Topic | Resources | Activity |
|---|---|---|---|---|
| 0 | Jan 23 | Introduction | ||
| 1 | Jan 30 | |||
Announcements
- Jan 23: This will be our class home page. For those enrolled in EE 269, assessment submissions will be through UVLe
References
- Book References
- M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing, Springer, 2005.
- Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman, “Digital Systems Testing & Testable Design”, IEEE Press, 1994
- Niraj Jha and Sandeep Gupta, “Testing of Digital Systems”, Cambridge University Press, 2003
- Z. Navabi, “Digital System Test and Testable Design”. Springer, 2011.
- Other References